| Abstract |
By combining elemental sensitive synchrotron X-ray techniques with high spatial resolution scanning tunneling microscopy, the authors are able to extract the element distributions at the sub-nm scale on the surfaces of high entropy alloys. In article number 2402442, Lauren Kim, TeYu Chien, and co-workers utilize X-ray assisted tunneling to enhance the elemental sensitivity with high spatial resolution to achieve this goal. This technique paves the path for correlating element local arrangements to the physical properties of the high entropy materials. |
| Authors |
Lauren J. Kim  , William R. Scougale , Prince Sharma  , Nozomi Shirato , Sarah Wieghold , Volker Rose , Wei Chen , Ganesh Balasubramanian , TeYu Chien
|
| Journal Info |
| Advanced Materials , vol: 36
, iss: 28
|
| Publication Date |
7/11/2024 |
| ISSN |
0935-9648 |
Type |
article |
| Open Access |
closed
|
| DOI |
https://doi.org/10.1002/adma.202470221 |
| Keywords |
Nanometre (Score: 0.80070126) , High-Entropy Alloys (Score: 0.42237458)
|
